p chart
p chart is a type of control chart used in statistical process control to monitor the proportion of defective items in a process over time.
Map the data fields
- Subgroup/Lot: This field represents the different lots or batches of items being inspected.
- Process variable: This field contains the number of defective items in each lot.
- Sample Size: This field indicates the number of items inspected in each lot.
- UCL: Optional field for custom upper control limits.
- LCL: Optional field for custom lower control limits.
- Central line: Optional field for custom center line values.
Calculation Methodology
The p-chart calculations are performed as follows:
Proportion defective (p̄)
p̄ = Total Defectives / Total Samples
Standard Error for Each Sample
Standard Error = √(p̄ × (1 - p̄) / Sample Size)
Control Limits
For each data point:
Upper Control Limit (UCL):
UCL = p̄ + (Z-Score × Standard Error)
Lower Control Limit (LCL):
LCL = p̄ - (Z-Score × Standard Error)
Center Line (CL):
CL = p̄ (overall proportion)
Proportion for Each Sample:
Proportion = Defectives / Sample Size
Notes:
- If custom limits are provided, they override the calculated values
- The Z-Score determines the confidence level (typically 3 for 99.7% confidence)
- Each sample can have a different sample size, resulting in variable control limits
- The actual proportion plotted is the number of defectives divided by the sample size for each lot